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Application Note

Analysis of Rare Earth Elements by Laser Ablation-ICP-MS with the NexION 2000 ICP-MS

NexION 2000 and laser ablation-ICP-MS for rare earth element analysis

Introduction

With the increasing development of high-tech applications, rare earth elements (REEs) are considered key elements for modern and future industries. Globally, there is growing pressure for analytical solutions that can accurately characterize and quantify REE content in a high-throughput manner to meet the application needs of expanding industries with reliable results to a diverse selection of mineral samples.

This work describes the in situ analysis of certified reference materials in selecting five mineral matrices using the NexION® 2000 ICP-MS coupled to a laser ablation (LA) system to demonstrate the performance capabilities of LA-ICP-MS for quantifying rare earth elements.

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