MappIR Accessory for 8” Wafers | 爱游戏平台注册登录
爱游戏平台注册登录
check quantity

MappIR Accessory for 8” Wafers

 

Semiconductor wafer design and manufacturing requires maintenance of efficient and high-quality production processes that ultimately meet customer specifications and demands. Fabrication and QA/QC managers are often challenged with unreliable testing that results in production interruptions, lack of confidence in testing, or complex equipment requiring extensive training.

MappIR accessory with Spectrum 3 FT-IR system helps ensure quality, reduce fail rates, drive out impurities and deliver production results. Whether improving the final product uniformity and reducing glass-forming temperatures in front-end fabrication or evaluating and verifying doping levels to maintain and optimize production processes, MappIR delivers high-quality results you can trust in an easy-to-use interface that requires minimal training.

貨號
寬度
L1270109
8.0 in
更多
L1270110
12.0 in
更多
Request Technical Support

請輸入有效數量

請登錄以添加收藏夾。

購物車為空

詳細信息

The 爱游戏平台注册登录 Spectrum™ 3 FT-IR spectrometer provides the sampling flexibility and performance in mid, near, and far infrared ranges through a single instrument to advance research and new product development. The highly configurable platform provides dependable, consistent, and trouble-free operation through years of service.

The MappIR accessory together with the Spectrum 3 FT-IR helps advance and accelerate your semiconductor design in the following areas:

Front-End Fabrication

  • Material identification
  • Curing verification
  • Testing to assess defects in chips
  • Contaminant or particle detection

Back-End Assembly

  • Final silicon wafer QA/QC testing
  • Defect analysis

規格

產品品牌名稱 MappIR
技術類型 FT-IR
寬度 8.0 in
資源
  • 所有

產品手冊

Spectrum 3互動探索手冊

The 爱游戏平台注册登录 Spectrum 3 FT-IR spectrometer provides the sampling flexibility and analytical performance in mid, near, and far infrared ranges through a single instrument to advance research and new product development in academia, chemicals, polymers, and pharmaceuticals. Read the interactive ...

PDF 2 MB
MappIR Mini Brochure

From fabrication to assembly, wafer design and manufacturing comes with many challenges. The Spectrum 3 MappIR FT-IR helps ensure quality, reduce fail rates, drive out impurities, and improve wafer production processes to accelerate product innovation and meet customer demands.< ...

PDF 2 MB

應用文獻

Semi-Automated FT-IR Measurements of Elemental Impurities in Silicon Wafers

Silicon wafer production is expected to grow in the coming years with increased demand for semiconductors especially in consumer electronics, automotives, and the use of silicon devices in the growing solar power industry. The Czochralski (CZ) process most widely adopted process in the industry f ...

PDF 1 MB
Baidu
map